Physics and electronics of the noble-metal/elemental-semiconductor interface formation: A status report

This publication has 73 references indexed in Scilit:

• Intermixing at the early stage of the Si(111)/Ag interface growth
  Applications of Surface Science, 1982
• Structural studies of Schottky barrier formation by means of surface EXAFS: Pd and Ag on Si(111) 7×7
  Journal of Vacuum Science and Technology, 1982
• Low energy electron diffraction, Auger electron spectroscopy and angle-resolved photoemission from silver films on Si(100) and Si(111)
  Thin Solid Films, 1982
• Structural and electronic properties of cleaved Si(111) upon room-temperature formation of an interface with Ag
  Physical Review B, 1981
• The structural and electronic properties of cleaved silicon (111) surfaces following adsorption of silver
  Applications of Surface Science, 1981
• New Models for Metal-Induced Reconstructions on Si(111)
  Physical Review Letters, 1981
• Summary Abstract: Electronic surface properties and Schottky barriers for diamond (111)
  Journal of Vacuum Science and Technology, 1980
• Systematics on the electron states of silicon d-metal interfaces
  Journal of Vacuum Science and Technology, 1980
• Photoemission studies of the silicon-gold interface
  Physical Review B, 1979
• Thermodynamic investigation of copper + silicon melts
  The Journal of Chemical Thermodynamics, 1979