A Two-Position Probe Method of Microwave Impedance Measurements for the Determination of the Electrical Properties of Indium Antimonide. Part II
- 1 May 1965
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 36 (5) , 1659-1663
- https://doi.org/10.1063/1.1703104
Abstract
A comparatively simple procedure was developed for measuring the impedance representation of a wave-guide obstacle. The Smith chart location of the impedance representation of the obstacle is derived from voltage measurements at two fixed probe positions. This technique was applied to the case of a thin inductive post of indium antimonide at 77°K. The electrical properties of the post material were inferred from the impedance using the concepts of Part I. Large impedance charges attributable to the pinch effect agreed with theoretical predictions over a small range of applied electric field values.This publication has 6 references indexed in Scilit:
- Microwave Impedance of Semiconductor Posts in Waveguides. Part IJournal of Applied Physics, 1965
- Hot Electrons in Indium AntimonidePhysical Review B, 1963
- Observations of Electron-Hole Current Pinching in Indium AntimonidePhysical Review B, 1961
- High electric field effects in n-indium antimonideJournal of Physics and Chemistry of Solids, 1959
- The influence of interelectronic collisions on conduction and breakdown in polar crystalsProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1958
- High Electric Field Effects in-Indium AntimonidePhysical Review B, 1958