Infrared scatterplate interferometry
- 15 September 1980
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 19 (18) , 3219-3223
- https://doi.org/10.1364/ao.19.003219
Abstract
Scatterplate inferferometry in the IR (λ = 10.6 μm) is virtually the same as that in the visible except for an appropriate change in optical materials. Techniques for its fabrication and alignment are described. Some of the side effects produced by the pyroelectric vidicon that are peculiar to scatterplate interferometry are discussed.Keywords
This publication has 3 references indexed in Scilit:
- Rough surface interferometry at 106 μmApplied Optics, 1980
- Transmittance Characteristics of Surface Diffusers and the Design of Nearly Band-Limited Binary Diffusers*Journal of the Optical Society of America, 1972
- Scatter Fringes of Equal ThicknessNature, 1953