Electrical Size Effect in Aluminum
- 1 August 1963
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 34 (8) , 2230-2232
- https://doi.org/10.1063/1.1702718
Abstract
The effect of specimen size on the residual electrical resistivity has been measured for six types of superpurity aluminum. The specimens were strips with thicknesses between 1.5 and 0.01 mm. The results are compared with Fuchs' theory for the resistance of thin films. The measurements on the four purest materials gave good agreement with theoretical curves, but the variations in the constant ρ·l (bulk resistivity times bulk mean free path) were much larger than expected from the experimental error. The measurements on the two least pure materials could not be fitted to a theoretical curve, although the individual points are reproducible.This publication has 3 references indexed in Scilit:
- Zone Refining of AluminumReview of Scientific Instruments, 1963
- The mean free path of electrons in metalsAdvances in Physics, 1952
- The electrical conductivity of thin wiresProceedings of the Royal Society of London. Series A. Mathematical and Physical Sciences, 1950