Depth Profile Measurement by Secondary Ion Mass Spectrometry for Determining the Tracer Diffusivity of Oxygen in Rutile
- 1 September 1979
- journal article
- Published by Wiley in Journal of the American Ceramic Society
- Vol. 62 (9-10) , 443-446
- https://doi.org/10.1111/j.1151-2916.1979.tb19101.x
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Oxygen tracer diffusion in the magnéli phases TinO2n−1Journal of Physics and Chemistry of Solids, 1976
- Secondary ion emission for surface and in-depth analysis of tantalum thin filmsAnalytical Chemistry, 1973
- Oxygen diffusion in single crystals of titanium dioxideJournal of Inorganic and Nuclear Chemistry, 1971
- Uranium and oxygen self-diffusion in UO2Journal of Nuclear Materials, 1969
- Diffusion of oxygen in growing zirconia filmsJournal of Nuclear Materials, 1968
- Note on the defect structure of rutile (TiO2)Journal of the Less Common Metals, 1967
- Diffusion of Transition Metal Ions into Rutile (TiO[sub 2])Journal of the Electrochemical Society, 1966
- Sauerstoff-selbstdiffusion in RutilkristallenJournal of Physics and Chemistry of Solids, 1965
- Thermogravimetric studies of the defect structure of rutile (TiO2)Journal of Physics and Chemistry of Solids, 1962
- The TiO2 phase explored by the lattice constant and density methodActa Crystallographica, 1961