In-depth information from auger electron spectroscopy
- 31 October 1974
- journal article
- Published by Elsevier in Surface Science
- Vol. 45 (2) , 409-418
- https://doi.org/10.1016/0039-6028(74)90178-2
Abstract
No abstract availableKeywords
This publication has 14 references indexed in Scilit:
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- Quantitative aspects of Auger electron spectroscopySurface Science, 1972
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- Ellipsometry and the clean surfaces of silicon and germaniumSurface Science, 1971
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