Novel approach for structure analysis by x-ray Raman scattering
- 15 December 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 36 (17) , 9410-9412
- https://doi.org/10.1103/physrevb.36.9410
Abstract
An oscillation similar to that in extended x-ray absorption fine-structure (EXAFS) measurements was observed in the x-ray Raman spectra of graphite by exciting 8265-eV x rays from synchrotron radiation. From an analysis employing the formula used for EXAFS, the carbon-carbon interatomic distances are obtained which are in good agreement with the known values in graphite. Thus, x-ray Raman scattering by hard x rays is a very promising method for the determination of the local structure around light elements.Keywords
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