Mapping of microelectric and magnetic fields with double-exposure electron holography
- 18 January 1988
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 52 (3) , 176-178
- https://doi.org/10.1063/1.99511
Abstract
The double-exposure electron holographic technique has been put into practical use for the first time. By this method an accurate recording of the distribution of electric and magnetic fields can be directly obtained by the electron microscope without resorting to sophisticated optical manipulation of the holograms. Problems concerning the operative definition of the contour maps are discussed. Experimental results are presented.Keywords
This publication has 6 references indexed in Scilit:
- Observation of electrostatic fields by electron holography: The case of reverse-biased p-n junctionsPublished by Elsevier ,2002
- Electron holography to image magnetic domains (invited)Journal of Applied Physics, 1987
- Electron Holographic Observations of the Electrostatic Field Associated with Thin Reverse-BiasedJunctionsPhysical Review Letters, 1985
- Interferometric and holographic techniques in transmission electron microscopy for the observation of magnetic domain structuresIEEE Transactions on Magnetics, 1984
- Holography in Electron MicroscopyPublished by Elsevier ,1982
- Holographic InterferometryJournal of Applied Physics, 1966