Substrate signal suppression in Raman spectra of sputter deposited TiO2 films
- 1 December 1984
- journal article
- letter
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 81 (11) , 5211-5213
- https://doi.org/10.1063/1.447470
Abstract
Polarized Raman scattering measurements of thin sputter deposited TiO2 films on silica substrates are reported and demonstrate supression of substrate Raman scattering when one specific component of the scattered radiation is analyzed.Keywords
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