Study of the first-stage relaxation in ZnTe/(001)CdTe strained layers
- 27 June 1994
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 64 (26) , 3631-3633
- https://doi.org/10.1063/1.111227
Abstract
The first stages of the growth of highly strained ZnTe on (001) CdTe are studied in details by reflection high-energy electron diffraction analysis. Below the critical thickness, small lattice oscillations attributed to a nontetragonal elastic distortion are observed on a system in tensile stress. An effect of Zn excess pressure on the critical thickness is demonstrated. Exposure at 280 °C of the CdTe(001) surface under Zn flux leads to the formation of a c(2×2) Zn terminated surface with about 50% Zn coverage. Such a pretreatment reduces the critical thickness by about half a monolayer.Keywords
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