Cryogenic wafer prober for Josephson devices

• 1 May 1983
• journal article
• Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
• Vol. 19  (3) , 1190-1192
• https://doi.org/10.1109/tmag.1983.1062335

Abstract

Keywords

• HELIUM
• PALLADIUM
• JOSEPHSON DEVICES
• DEVICES A WAFER
• TESTING OF JOSEPHSON
• PROBE CARD