Characterization of molecular‐beam epitaxially grown CdTe surfaces by high‐energy electron diffraction and synchrotron radiation photoemission spectroscopy
- 1 May 1988
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology A
- Vol. 6 (3) , 1343-1347
- https://doi.org/10.1116/1.575698
Abstract
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