Interferometric stain measurement by arbitrarily configured surface-mounted, optical fibers
- 1 January 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Journal of Lightwave Technology
- Vol. 8 (10) , 1497-1503
- https://doi.org/10.1109/50.59188
Abstract
No abstract availableThis publication has 12 references indexed in Scilit:
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