Development of a new standard for test

Publisher Website

4 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/test.1990.114120

Abstract

No abstract available

This publication has 2 references indexed in Scilit:

UTILE system: a unified environment from simulation to test
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2003
Data exchange formats for testing
Microprocessing and Microprogramming, 1989