Scanning tunneling microscopy of β-SiC and YBa2Cu3O7−x ceramic surfaces

1 March 1988

journal article
Published by American Vacuum Society in Journal of Vacuum Science & Technology A

Vol. 6 (2) , 457-460
https://doi.org/10.1116/1.575395

Abstract

We have constructed a compact scanning tunneling microscope (STM) on a 6‐in.‐diam conflat flange for use in air and in ultrahigh vacuum. Topographies on a nanometer scale were imaged on a cubic β‐SiC(100) surface and a single‐phase polycrystalline YBa₂Cu₃O₇_−x surface with the STM at room temperature. In the case of the YBa₂Cu₃O₇_−x surface, we have succeeded in obtaining images showing the layered‐perovskite structure on an atomic scale.

Keywords

CERAMICS
SCANNING ELECTRON MICROSCOPY
SILICON CARBIDES
YTTRIUM OXIDES
BARIUM OXIDES
COPPER OXIDES
SURFACES
TOPOGRAPHY
CRYSTAL STRUCTURE
ELECTRON MICROSCOPES
DESIGN
FABRICATION
EXPERIMENTAL DATA
POLYCRYSTALS
SIC
(YBA
SCANNING TUNNELING MICROSCOPY

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