A Method for Measuring Extremely Small Non-Uniformities in the Optical Thickness of Evaporated Films
- 1 December 1949
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America
- Vol. 39 (12) , 1044-1045
- https://doi.org/10.1364/josa.39.001044
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 1 reference indexed in Scilit:
- Reflection from a Multilayer FilterJournal of the Optical Society of America, 1949