Measurement of X-ray spectral line wavelengths by using two Bragg reflections

• 1 June 1990
• journal article
• Published by Elsevier in Journal of X-Ray Science and Technology
• Vol. 2  (2) , 149-159
• https://doi.org/10.1016/0895-3996(90)90007-9

Abstract

Keywords

• WAVELENGTHS USING
• QUARTZ
• BRAGG REFLECTIONS
• LINE WAVELENGTHS
• LASER
• TWO BRAGG
• CRYSTAL