An impedance measurement method for double-gap klystron cavity
- 1 February 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 29 (2) , 316-320
- https://doi.org/10.1109/T-ED.1982.20702
Abstract
A new method has been developed for measuring the impedance of a two-gap cavity used in high-power klystrons. The principle is based on network analysis. The cavity under test is considered as a microwave network. The two gaps of the cavity and its output terminal are referred to as three ports. We then can use an impedance matrix to characterize this system, and the six independent impedance parameters can be found by measuring the input impedance seen from the output waveguide when the gaps are in different conditions; viz., either open, shorted, or perturbed. The gap impedance then can be deduced therefrom. It is shown that there are three impedances for a double-gap cavity instead of one for a single-gap cavity. Another problem dealt with here is how to evaluate the capacitance introduced by the perturbation. A few typical experimental results are presented.Keywords
This publication has 2 references indexed in Scilit:
- Measurement of Circuit Impedance of Periodically Loaded Structures by Frequency PerturbationProceedings of the IRE, 1954
- The Concept and Measurement of Impedance in Periodically Loaded Wave GuidesJournal of Applied Physics, 1952