Detection of Point Defect Inhomogeneities in III-V Semiconductors by Scanning-DLTS

Publisher Website

16 March 1986

journal article
research article
Published by Wiley in Physica Status Solidi (a)

Vol. 94 (1) , K21-K24
https://doi.org/10.1002/pssa.2210940163

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

A new spectroscopic technique for imaging the spatial distribution of nonradiative defects in a scanning transmission electron microscope
Applied Physics Letters, 1977