Experimental Correlation between Diagonal and Hall Conductivities of Silicon MOS inversion Layers in Strong Magnetic Fields
- 15 June 1989
- journal article
- Published by Physical Society of Japan in Journal of the Physics Society Japan
- Vol. 58 (6) , 1899-1902
- https://doi.org/10.1143/jpsj.58.1899
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Experiments on Scaling Relation of Conductivities in Silicon MOS Inversion Layers in Strong Magnetic FieldsJournal of the Physics Society Japan, 1987
- Scaling Functions Quantum Hall EffectJournal of the Physics Society Japan, 1986
- Universal scaling relation of conductivities in quantized Landau levelsSurface Science, 1986
- Electron Delocalization by a Magnetic Field in Two DimensionsPhysical Review Letters, 1983
- Hall Current Measurement under Strong Magnetic Fields for Silicon MOS Inversion LayersJournal of the Physics Society Japan, 1980