Measuring the lifetime of minority carriers in MIS structures

This publication has 4 references indexed in Scilit:

• On the determination of minority carrier lifetime from the transient response of an MOS capacitor
  IEEE Transactions on Electron Devices, 1967
• Minority carrier lifetime determination from inversion layer transient response
  IEEE Transactions on Electron Devices, 1967
• ELECTROLUMINESCENCE USING GaAs MIS STRUCTURES
  Applied Physics Letters, 1966
• Carrier concentration and minority carrier lifetime measurement in semiconductor epitaxial layers by the mos capacitance method
  Solid-State Electronics, 1966