Characterization of novel powder and thin film RGB phosphors for field emission display application
- 1 March 1997
- journal article
- Published by American Vacuum Society in Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
- Vol. 15 (2) , 507-511
- https://doi.org/10.1116/1.589281
Abstract
The spectral response, brightness, and outgassing characteristics of new, low-voltage phosphors for application in field emission flat panel displays, are presented. The tested phosphormaterials include combustion synthesized powders and thin films prepared by rf diode or magnetron sputtering, laser ablation, and molecular beam epitaxy. These cathodoluminescent materials are tested with e-beam excitation at currents up to 50 μA within the 200–2000 V (e.g., “low-voltage”) and 3–8 kV (e.g., “medium-voltage”) ranges. The spectral coordinates are compared to commercial low-voltage phosphors.Phosphor outgassing, as a function of time, is measured with a residual gas analyzer at fixed 50 μA beam current in the low-voltage range. We find that levels of outgassing stabilize to low values after the first few hours of excitation. The desorption rates measured for powderphosphor layers with different thicknesses are compared to desorption from thin films.Keywords
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