Inspection of out-of-plane surface movements over small areas using electronic Speckle Pattern Interferometry
- 1 January 1983
- journal article
- Published by Elsevier in Optics and Lasers in Engineering
- Vol. 4 (4) , 229-239
- https://doi.org/10.1016/0143-8166(83)90016-7
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- De-correlation Effects in Speckle-pattern Interferometry. 1. Wavelength change dependent de-correlation with application to contouring and surface roughness measurementOptica Acta: International Journal of Optics, 1977
- Plane-surface strain examination by speckle-pattern interferometry using electronic processingJournal of Strain Analysis, 1974
- Interferometric displacement measurement on scattering surfaces utilizing speckle effectJournal of Physics E: Scientific Instruments, 1970