Temperature dependence of the thickness of Langmuir multilayer assembly films
- 15 November 1980
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 22 (10) , 4898-4899
- https://doi.org/10.1103/physrevb.22.4898
Abstract
The thickness of Langmuir films was examined for temperatures ranging from - 193 up to 80°C by using x-ray diffraction. Up to around -40°C, the thickness remains almost constant or the thermal expansion coefficient . Beyond -20°C, the thickness tends to decrease; and increases with temperature.
Keywords
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