Temperature dependence of the thickness of Langmuir multilayer assembly films

Abstract
The thickness of Langmuir films was examined for temperatures ranging from - 193 up to 80°C by using x-ray diffraction. Up to around -40°C, the thickness remains almost constant or the thermal expansion coefficient α1×105 deg1. Beyond -20°C, the thickness tends to decrease; α<0 and |α| increases with temperature.

This publication has 4 references indexed in Scilit: