Automatisches Eilipsometer für hochgenaue Transmissionsmessungen an optisch doppelbrechenden Komponenten und Systemen / Automatic ellipsometer for high precision measurement of optical birefringent components and systems
- 1 December 1986
- journal article
- research article
- Published by Walter de Gruyter GmbH in TM - Technisches Messen
- Vol. 53 (JG) , 384-389
- https://doi.org/10.1524/teme.1986.53.jg.384
Abstract
Article Automatisches Eilipsometer für hochgenaue Transmissionsmessungen an optisch doppelbrechenden Komponenten und Systemen / Automatic ellipsometer for high precision measurement of optical birefringent components and systems was published on December 1, 1986 in the journal tm - Technisches Messen (volume 53, issue JG).Keywords
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