A study of the interaction of oxygen with chromium using ion bombardment induced photon and secondary ion emission

This publication has 17 references indexed in Scilit:

• The spectroscopy of ion-induced photon emission and its application to quantitative surface analysis
  Surface Science, 1977
• Evaluation of the local thermal equilibrium model for quantitative secondary ion mass spectrometric analysis
  Analytical Chemistry, 1976
• On the use of the saha-eggert equation for quantitative sims analysis using argon primary ions
  Surface Science, 1976
• An ion beam spectrochemical analyser with application to the analysis of silicate minerals
  Spectrochimica Acta Part B: Atomic Spectroscopy, 1975
• Practicality of the thermodynamic model for quantitative ion probe microanalysis of low alloy steels
  Analytical Chemistry, 1975
• Energy density and time constant of heavy-ion-induced elastic-collision spikes in solids
  Applied Physics Letters, 1974
• Fundamental Studies on Quantitative Analysis in Ion Probe Microanalyzer
  Japanese Journal of Applied Physics, 1974
• Investigation of surface reactions by the static method of secondary ion mass spectrometry: II. The oxidation of chromium in the monolayer range
  Surface Science, 1973
• Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectra
  Analytical Chemistry, 1973
• Surface Composition Determined by Analysis of Impact Radiation
  Science, 1972