Loading effects in resistance scaling

Publisher Website

24 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/cpem.1996.547101

Abstract

No abstract available

Keywords

LOADING EFFECTS IN RESISTANCE SCALING

This publication has 4 references indexed in Scilit:

Improvements in resistance scaling at NIST using cryogenic current comparators
IEEE Transactions on Instrumentation and Measurement, 1993
Determination of the time-dependence of Omega /sub NBS/ using the quantized Hall resistance
IEEE Transactions on Instrumentation and Measurement, 1989
New realization of the ohm and farad using the NBS calculable capacitor
IEEE Transactions on Instrumentation and Measurement, 1989
Increased Accuracy for Resistance Measurements
IEEE Transactions on Instrumentation and Measurement, 1966