Onset for Superfluid Flow inHe4Films on a Variety of Substrates

Abstract
The onset of superfluid flow in He4 films was measured between 1.37 and 2.13 K on substrates of NaF, CaF2, SiO2, Si, and Grafoil. Values of the Van der Waals constant of 19, 26, and 65 K were obtained for NaF, SiO2, and Grafoil, respectively. In addition, a precise measurement of the critical thickness of the liquid-helium film was obtained, taking into account a small correction for the influence of the substrate.