Studies of Neutron-Produced Defects in Silicon by Deep-Level Transient Spectroscopy

• 1 February 1979
• journal article
• Published by IOP Publishing in Japanese Journal of Applied Physics
• Vol. 18  (2) , 309-315
• https://doi.org/10.1143/jjap.18.309

Abstract

Keywords

• NEUTRON PRODUCED
• LEVEL TRANSIENT
• PRODUCED DEFECTS
• TRANSIENT SPECTROSCOPY
• DEEP LEVEL
• DEFECTS IN SILICON