One-to-one correspondence between slowly decaying interfacial profiles and reflectivity
- 12 January 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 58 (2) , 140-143
- https://doi.org/10.1103/physrevlett.58.140
Abstract
A variety of mechanisms give rise to interfacial profiles which approach their bulk values asymptotically like ; for most of them 0<μ≤2. In these cases the exponent as well as the amplitude can be determined uniquely by reflectivity measurements slightly above the angle of total external reflection.
Keywords
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