Signal fidelity and tracking force in stylus profilometry
- 1 February 1992
- journal article
- Published by Elsevier in International Journal of Machine Tools and Manufacture
- Vol. 32 (1-2) , 239-245
- https://doi.org/10.1016/0890-6955(92)90084-t
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Sub-nanometre displacements calibration using X-ray interferometryMeasurement Science and Technology, 1990
- The digitization of surface profilesWear, 1979