Accurate measurement of the Si structure factor by the Pendellösung method

• 1 November 1986
• journal article
• research article
• Published by International Union of Crystallography (IUCr) in Acta Crystallographica Section A Foundations of Crystallography
• Vol. 42  (6) , 469-478
• https://doi.org/10.1107/s0108767386098860

Abstract

Keywords

• NET PLANES
• STANDARD MODEL
• STRUCTURE FACTOR
• ORDER PLANES
• ACCURACY LEVEL
• CHARGE
• BONDING
• HARMONIC