Reflection extended x‐ray absorption fine‐structure measurements on Ni/C and Ni_xSi_y/C multilayered reflection coatings

Publisher Website

1 July 1988

journal article
Published by American Vacuum Society in Journal of Vacuum Science & Technology A

Vol. 6 (4) , 2182-2187
https://doi.org/10.1116/1.575009

Abstract

No abstract available

Keywords

EXTENDED X RAY ABSORPTION FINE STRUCTURE

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