ESCA investigations of ion beam effects on surfaces

This publication has 18 references indexed in Scilit:

• ESCA investigation of the oxide layers on some Cr containing alloys
  Surface Science, 1977
• ESCA Investigations of Ion Beam Effects on Surfaces
  Physica Scripta, 1977
• Residual defects in Si produced by recoil implantation of oxygen
  Applied Physics Letters, 1975
• AES studies of surface composition of AgCu alloys
  Surface Science, 1975
• Analysis profiles of oxide films on chrome steel by auger emission and x-ray photoelectron spectroscopies
  Journal of Electron Spectroscopy and Related Phenomena, 1974
• Surface investigation of solids by the statical method of secondary ion mass spectroscopy (SIMS)
  Surface Science, 1973
• Implications in the use of secondary ion mass spectrometry to investigate impurity concentration profiles in solids
  Radiation Effects, 1973
• Investigation of low-energy ion scattering as a surface analytical technique
  Surface Science, 1972
• THE EFFECT OF ION BOMBARDMENT ON THE PHYSICAL PROPERTIES OF SEMICONDUCTORS
  Soviet Physics Uspekhi, 1971
• Auger electron spectroscopy
  Surface Science, 1971