Defocusing distances, magnifications and high resolution in Lorentz electron microscopy
- 1 December 1971
- journal article
- Published by IOP Publishing in Journal of Physics E: Scientific Instruments
- Vol. 4 (12) , 1079-1080
- https://doi.org/10.1088/0022-3735/4/12/053
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- The investigation of domain walls in thin sections of iron by the electron interference methodPhilosophical Magazine, 1969
- High-Resolution Lorentz MicroscopyJournal of Applied Physics, 1968
- Determination of Magnetization Distribution in Thin Films Using Electron MicroscopyJournal of Applied Physics, 1960