Setting Test Intervals and Allowable Bypass Times as a Function of Protection System Goals

1 January 1971

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 18 (1) , 488-494
https://doi.org/10.1109/TNS.1971.4325914

Abstract

This analysis demonstrates the usefulness of availability design goals for determining required periodic test intervals and allowable bypass times as permitted by IEEE-279 criteria. Formulas are developed for calculating these times for instrumentation logic configurations common to reactor protection systems. Both simultaneous and uniformly staggered test schedules are considered. In addition to sample problems illustrating the application of these formulas, nomographs are presented for rapid graphical determination of test intervals and bypass times.

Keywords

SYSTEM TESTING
AVAILABILITY
INDUCTORS
POWER SYSTEM PROTECTION
LOGIC TESTING
CALIBRATION
SECTIONS
REACTOR INSTRUMENTATION
SAFETY
NUCLEAR POWER GENERATION

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