Surface-temperature measurement during pulsed laser-induced thermal desorption of xenon from a copper film

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Abstract
Surface temperatures during pulsed laser-induced thermal desorption of xenon from a 28-mm-thick copper film are determined directly with a pyroelectric calorimeter as the substrate. Simultaneously, time-of-flight data of desorbed xenon atoms are recorded with a quadrupole mass spectrometer. From these data equivalent surface temperatures and heating rates can be derived. The calorimetric temperatures are compared with temperatures derived from time-of-flight data.

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