Electro-thermomigration in Al/Si, Au/Si interdigitized test structures
- 1 July 1973
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 44 (7) , 2975-2979
- https://doi.org/10.1063/1.1662692
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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