Moire Interferometry Applied To Topographic Contour Measurement

Publisher Website
Google Scholar
Abstract
Moire interferometry in this paper is extended to topographic contour measurement of an arbitrary object. The principle of the proposed method is different from that of projection moire and shadow moire methods in both the moire fringe forming mechanism and the w displacement evaluation. The advantage of the present method over the others is that it has a very high sensitivity which can be the order of Amm. As an experimental verification, the method is applied to the topographic contour measurement of a cylindrical shell with and without a diametric point loading.© (1989) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

This publication has 0 references indexed in Scilit: