Estimating Weibull Parameters for a General Class of Devices from Limited Failure Data

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Abstract
Relatively simple approaches to estimating Weibull parameters for a general class of devices are developed through regression models. It is assumed that data are collected on a number of device types belonging to a general class. For each device type, the only information available is the number of devices being observed, the total time observed and the total number of failures. By assuming a constant shape parameter and a scale parameter that may vary with the characteristics of the device-type, the least squares method is used to provide estimates of the parameters of a two-parameter Weibull distribution for both replacement and nonreplacement data. An approach is also suggested for dealing with troublesome cases of zero failure occurrences. A numerical example is provided to illustrate the approach.

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