Abstract
Ambipolar diffusion and electron attachment rates were measured in nitric oxide at pressures from 0.01 to 16 Torr and at temperatures from 196 to 358°K. The gas was photoionized by single pulses of ultraviolet radiation, at and near Lyman-α from a hydrogen lamp. Pulse lengths ranged from 10 to 300 μsec and ionization levels were kept low to reduce electron-ion recombination. Rates for the latter process are reported in a separate paper. Electron loss rates were measured by a microwave-cavity method used to record the decay following a single ionizing pulse. Ion identification was made by a mass spectrometer which sampled the ions diffusing through a small hole in the wall of the microwave cavity. Ultrahigh-vacuum techniques were used in gas purification and in production and measurement of ionization. The diffusion results are to some extent consistent with the theory of diffusion of electrons and a single positive ion species in the presence of negative ions. The mass-spectrometer observations indicate that NO+ is the dominant positive ion in photoionized NO at all pressures. The measured mobility of NO+ for 298°K, referred to 0°C and 760 Torr, is 1.9±0.2 cm2 sec1 V1, corresponding to a Dap of 83±8 cm2 Torr sec1. The mobility decreases slowly as the gas temperature is raised from 196 to 358°K. At gas densities near 1017 cm3, the attachment results are characteristic of a three-body process, but at higher densities there is an anomalous rise in the attachemnt coefficient. The apparent three-body attachment coefficients for densities near 1017 cm3 are 6.8±0.7×1031 cm6 sec1 at 196°K, 2.2±0.2×1031 at 298°K, and 1.1±0.1×1031 at 358°K and exhibit approximately at T3 temperature dependence. The principal negative ion observed with the mass spectrometer was NO2, and no NO or (NO)2 ions were detected. Direct attachment to NO2, present as a minute impurity, seems unlikely; the NO2 ions may be formed by rapid charge transfer from a primary negative ion or by an attachment reaction involving rearrangement.