Segregation of Alloying Elements into Passive Films

Publisher Website
Google Scholar
Abstract
The segregation of Al, Ti, and Mo into passive films grown anodically on , , and alloys in and in , buffer solutions at 25°C has been determined using surface analysis by laser ionization. The alloying elements are found to segregate into the inner barrier layer of the film to the following extents: . For Ni‐0.5 Ti and Ni‐3 Ti alloys, the extent of segregation decreases with increasing voltage of formation of the passive film, as predicted by the point defect model. Hydrogen is found to be concentrated in the outer regions of the film but significant hydrogen is detected in the barrier layer and in the underlying alloy phase.

This publication has 0 references indexed in Scilit: