Fractal characterization of rough surfaces using secondary electrons

1 March 1987

journal article
research article
Published by Taylor & Francis in Philosophical Magazine Letters

Vol. 55 (3) , 99-104
https://doi.org/10.1080/09500838708228739

Abstract

We propose a novel and rapid method of measuring the total area of a rough surface using a scanning electron microscope. We show, under certain circumstances, that this area is almost exactly proportional to the secondary electron yield from the surface. The relationship of this measurement to fractal characterization is discussed.

Keywords

ROUGH SURFACES
USING SECONDARY
FRACTAL CHARACTERIZATION
SECONDARY ELECTRONS
SURFACES USING

This publication has 2 references indexed in Scilit:

Fractal character of fracture surfaces of metals
Nature, 1984
Secondary Electron Emission from Solids
Published by Elsevier ,1959