HOT-ELECTRON EMISSION FROM COMPOSITE METAL-INSULATOR MICROEMITTERS

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Abstract
Field emission microscopy and electron spectroscopy have been used to study the emission characteristics of several types of metal-insulator microemitters : these include resin-, alumina-, and hydrocarbon-coated tungsten, and glass-coated silver structures. Details are given of the threshold switch-on phenomenon, the reversible current-voltage characteristic, the high-field saturated emission current, the emission image, and the field-dependence of the spectral shift and FWHM. Consideration is also given to the technological significance of these findings

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