Oxygen Microclusters in Quenched Si Studied by Positron Annihilation

• 1 January 1992
• journal article
• Published by Trans Tech Publications, Ltd. in Materials Science Forum
• Vol. 105-110, 1301-1304
• https://doi.org/10.4028/www.scientific.net/msf.105-110.1301

Abstract

Keywords

• DOPPLER BROADENING PROFILE
• LIFETIME
• MICROCLUSTER
• OXYGEN
• QUENCHING
• SILICON