The inverse problem of the phenomenological theory of the optical properties of thin films
- 1 December 1978
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 55 (2) , 201-209
- https://doi.org/10.1016/0040-6090(78)90050-0
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Thickness dependence of the current carrier concentration in bismuth filmsThin Solid Films, 1976
- Determination of Optical Constants from Intensity Measurements at Normal IncidenceApplied Optics, 1968
- A theoretical study of the sensitivities of some normal incidence methods for measuring the optical constants and thicknesses of thin filmsBritish Journal of Applied Physics, 1967
- Computational Method for Determining n and k for a Thin Film from the Measured Reflectance, Transmittance, and Film ThicknessApplied Optics, 1966
- Über das Minimumproblem für Funktionale in Banachschen RäumenMathematische Annalen, 1963
- Evaluation and Analysis of Optical and Electrical Constants of Thin Films as Functions of Reflectance and Transmission Data by Electronic Digital Computation*Journal of the Optical Society of America, 1955
- Die optischen Konstanten dünner Goldschichten aus Durchlässigkeits- und Reflexionsmessungen von Ultrarot bis UltraviolettThe European Physical Journal A, 1937
- Zur Optik dünner MetallfilmeThe European Physical Journal A, 1937
- Die optischen Konstanten durchsichtigen SilbersThe European Physical Journal A, 1933