Matrix Effect Studies by Comparative SNMS and SIMS of OxidizedCe, Gd and Ta Surfaces
- 1 January 1979
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Comparative SNMS and SIMS studies of oxidized Ce and GdSurface Science, 1979
- Sputtering of Ta2O5 by Ar+ ions at energies below 1 keVSurface Science, 1978
- Sputtered neutral mass spectrometry (SNMS) as a tool for chemical surface analysis and depth profilingApplied Physics B Laser and Optics, 1977
- A method for surface analysis by sputtered neutralsPhysics Letters A, 1972