Instrumentation for millisecond-resolution scattering studies (invited)
- 1 July 1989
- journal article
- research article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (7) , 1537-1540
- https://doi.org/10.1063/1.1141031
Abstract
Time‐resolved x‐ray scattering studies of phase transition kinetics have been carried out using the wide‐bandpass monochromator and fast linear position‐sensitive detector system at the IBM/MIT beamline X‐20C at the National Synchrotron Light Source (NSLS). We report here on the instrumentation that has been developed for these studies, and in particular on the methods used to measure, change, and control sample temperature with millisecond resolution.Keywords
This publication has 4 references indexed in Scilit:
- Nucleated and continuous ordering inAuPhysical Review Letters, 1988
- Time-resolved X-ray scattering using a high-intensity multilayer monochromatorNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1988
- Crystallization of amorphous NiZr2Materials Science and Engineering, 1988
- Theory for the early stages of phase separation: The long-range-force limitPhysical Review B, 1985