Accelerated Life Testing and Reliability of High K Multilayer Ceramic Capacitors
- 1 September 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 5 (3) , 297-300
- https://doi.org/10.1109/tchmt.1982.1135974
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- Reliability Evaluation and Failure Analysis for Multilayer Ceramic Chip CapacitorsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1978
- Oxygen diffusion in BaTiO3 ceramicPhysica Status Solidi (a), 1976
- Conduction—Ionic or Electronic—in BaTiO3The Journal of Chemical Physics, 1964
- Dielectric Breakdown of Polycrystalline BaTiO3Journal of the Physics Society Japan, 1964