Characterization of sputtered films of Tℓ-Ba-Ca-Cu-O
- 15 October 1990
- journal article
- Published by Elsevier in Journal of the Less Common Metals
- Vol. 164-165, 956-963
- https://doi.org/10.1016/0022-5088(90)90507-g
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Light scattering spectroscopy of Tl-based superconductors: phonon and electronic excitationsPhysica C: Superconductivity and its Applications, 1989
- Raman scattering from cupric oxideSolid State Communications, 1989
- Raman analysis of TlCa2Ba2Cu3O19 and Tl2Ca2Ba2Cu3O10 crystalsPhysica C: Superconductivity and its Applications, 1989
- Systematic raman study ofhigh-temperature superconductorsPhysical Review B, 1988
- Raman microprobe analysis of Tl-Ca-Ba-Cu-O polycrystalsSolid State Communications, 1988
- Crystal Structure of Tl 2 Ba 2 Ca 2 Cu 3 O 10 , a 125 K SuperconductorScience, 1988
- Crystal structure of the high-temperature superconductor TI2Ba2CaCu2O8Nature, 1988